[IEEE 2018 25th IEEE International Conference on Image Processing (ICIP) - Athens (2018.10.7-2018.10.10)] 2018 25th IEEE International Conference on Image Processing (ICIP) - AAM: AN Assessment Metric of Axial Chromatic Aberration
Helou, Majed El, Dumbgen, Frederike, Siisstrunk, SabineYear:
2018
Language:
english
DOI:
10.1109/ICIP.2018.8451377
File:
PDF, 24 KB
english, 2018