[IEEE 2019 International Conference on Platform Technology and Service (PlatCon) - Jeju, Korea (South) (2019.1.28-2019.1.30)] 2019 International Conference on Platform Technology and Service (PlatCon) - Digital Forensic Artifact Collection Technique using Application Decompilation
Yoo, Dongkyun, Shin, Yeonghun, Kim, SungJin, Kim, HyunJin, Kwon, SungMoon, Shon, TaeshikYear:
2019
Language:
english
DOI:
10.1109/PlatCon.2019.8668959
File:
PDF, 16 KB
english, 2019