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Interface trap-dependent linearity assessment in single and dual metal gate junctionless accumulation mode (surrounding gate) nanowire MOSFET
Trivedi, Nitin, Haldar, Subhasis, Deswal, S. S., Gupta, Mridula, Gupta, R. S.Volume:
125
Language:
english
Journal:
Applied Physics A
DOI:
10.1007/s00339-019-2647-0
Date:
May, 2019
File:
PDF, 2.08 MB
english, 2019