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Solid-State Electronics 2019 / 3

Investigation of built-in bipolar junction transistor in FD-SOI BIMOS

Bédécarrats, Thomas, Galy, Philippe, Fenouillet-Béranger, Claire, Cristoloveanu, Sorin
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Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2019.03.057
Date:
March, 2019
File:
PDF, 1.82 MB
english, 2019
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