Operando Analysis of Electron Devices Using Nanodiamond...

Operando Analysis of Electron Devices Using Nanodiamond Thin Films Containing Nitrogen-Vacancy Centers

Uchiyama, Haruki, Saijo, Soya, Kishimoto, Shigeru, Ishi-Hayase, Junko, Ohno, Yutaka
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Volume:
4
Language:
english
Journal:
ACS Omega
DOI:
10.1021/acsomega.9b00344
Date:
April, 2019
File:
PDF, 2.23 MB
english, 2019
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