![](/img/cover-not-exists.png)
Operando Analysis of Electron Devices Using Nanodiamond Thin Films Containing Nitrogen-Vacancy Centers
Uchiyama, Haruki, Saijo, Soya, Kishimoto, Shigeru, Ishi-Hayase, Junko, Ohno, YutakaVolume:
4
Language:
english
Journal:
ACS Omega
DOI:
10.1021/acsomega.9b00344
Date:
April, 2019
File:
PDF, 2.23 MB
english, 2019