Scanning thermal microscopy based on a modified atomic...

Journal de Physique IV (Proceedings) /Le Journal de Physique IV 2005 / 06 Vol. 125

Scanning thermal microscopy based on a modified atomic force microscope combined with pyroelectric detection

Antoniow, J.-S., Chirtoc, M., Trannoy, N., Raphael, O., Pelzl, J.
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Volume:
125
Language:
english
Journal:
Journal de Physique IV (Proceedings)
DOI:
10.1051/jp4:2005125026
Date:
June, 2005
File:
PDF, 284 KB
english, 2005
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