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Structural Characterization of ZnTe Grown by Atomic-Layer-Deposition Regime on GaAs and GaSb (100) Oriented Substrates
Castillo-Ojeda, Roberto Saúl, Díaz-Reyes, Joel, Galván-Arellano, Miguel, Anda-Salazar, Francisco de, Contreras-Rascon, Jorge Indalecio, Peralta-Clara, María de la Cruz, Veloz-Rendón, Julieta SaloméVolume:
20
Journal:
Materials Research
DOI:
10.1590/1980-5373-MR-2016-0181
Date:
March, 2017
File:
PDF, 2.06 MB
2017