Ultrafast optics establishes metrological standards in high-frequency electronics
M. Bieler, M. Spitzer, G. Hein, U. Siegner, E.O. GöbelVolume:
78
Language:
english
Pages:
5
DOI:
10.1007/s00339-003-2399-7
Date:
March, 2004
File:
PDF, 223 KB
english, 2004