Ultrafast optics establishes metrological standards in...

Ultrafast optics establishes metrological standards in high-frequency electronics

M. Bieler, M. Spitzer, G. Hein, U. Siegner, E.O. Göbel
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Volume:
78
Language:
english
Pages:
5
DOI:
10.1007/s00339-003-2399-7
Date:
March, 2004
File:
PDF, 223 KB
english, 2004
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