Atomic force microscopy as a suitable technique for surface...

Atomic force microscopy as a suitable technique for surface characterization of activated composite membranes for metal ion facilitated transport

J. Macanás, L. Palacio, P. Prádanos, A. Hernández, M. Muñoz
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Volume:
84
Language:
english
Pages:
8
DOI:
10.1007/s00339-006-3609-x
Date:
August, 2006
File:
PDF, 850 KB
english, 2006
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