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Shallow energy levels induced byγrays in standard and oxygenated floating zone silicon
D. Menichelli, M. Scaringella, S. Miglio, M. Bruzzi, I. Pintilie, E. FretwurstVolume:
84
Language:
english
Pages:
5
DOI:
10.1007/s00339-006-3640-y
Date:
September, 2006
File:
PDF, 265 KB
english, 2006