X-ray and transmission electron microscopy characterization...

X-ray and transmission electron microscopy characterization of twinned CdO thin films grown ona-plane sapphire by metalorganic vapour phase epitaxy

M.C. Martínez-Tomás, J. Zúñiga-Pérez, P. Vennéguès, O. Tottereau, V. Muñoz-Sanjosé
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
88
Language:
english
Pages:
4
DOI:
10.1007/s00339-007-3977-x
Date:
July, 2007
File:
PDF, 334 KB
english, 2007
Conversion to is in progress
Conversion to is failed