[IEEE 2018 IEEE 9th International Conference on Biometrics...

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[IEEE 2018 IEEE 9th International Conference on Biometrics Theory, Applications and Systems (BTAS) - Redondo Beach, CA, USA (2018.10.22-2018.10.25)] 2018 IEEE 9th International Conference on Biometrics Theory, Applications and Systems (BTAS) - Deep Sketch-Photo Face Recognition Assisted by Facial Attributes

Iranmanesh, Seyed Mehdi, Kazemi, Hadi, Soleymani, Sobhan, Dabouei, Ali, Nasrabadi, Nasser M.
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Year:
2018
Language:
english
DOI:
10.1109/BTAS.2018.8698564
File:
PDF, 41 KB
english, 2018
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