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[IEEE 2018 12th IEEE International Conference on Anti-counterfeiting, Security, and Identification (ASID) - Xiamen, China (2018.11.9-2018.11.11)] 2018 12th IEEE International Conference on Anti-counterfeiting, Security, and Identification (ASID) - An Offset Calibration Technique in a SAR ADC for Biomedical Applications
Liu, Zhaozhe, Wang, Wensi, Wan, Peiyuan, Geng, Jiarong, Chen, ZhijieYear:
2018
Language:
english
DOI:
10.1109/ICASID.2018.8693119
File:
PDF, 1.81 MB
english, 2018