Tibetan-Plateau Based Real-Time Testing and Simulations of Single-Bit and Multiple-Cell Upsets in QDRII+ SRAM Devices
Zhang, Zhangang, Lei, Zhifeng, Tong, Teng, Li, Xiaohui, Xi, Kai, Peng, Chao, Shi, Qian, He, Yujuan, Huang, Yun, En, YunfeiYear:
2019
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2019.2913190
File:
PDF, 938 KB
english, 2019