The joined use of n.i. spectroscopic analyses – FTIR,...

Applied Physics A: Materials Science & Processing 2008 / 07 Vol. 92; Iss. 1

The joined use of n.i. spectroscopic analyses – FTIR, Raman, visible reflectance spectrometry and EDXRF – to study drawings and illuminated manuscripts

S. Bruni, S. Caglio, V. Guglielmi, G. Poldi
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Volume:
92
Language:
english
Pages:
6
DOI:
10.1007/s00339-008-4454-x
Date:
July, 2008
File:
PDF, 425 KB
english, 2008
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