A non invasive method to detect stratigraphy, thicknesses...

Applied Physics A: Materials Science & Processing 2008 / 07 Vol. 92; Iss. 1

A non invasive method to detect stratigraphy, thicknesses and pigment concentration of pictorial multilayers based on EDXRF and vis-RS: in situ applications

L. Bonizzoni, S. Caglio, A. Galli, G. Poldi
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Volume:
92
Language:
english
Pages:
8
DOI:
10.1007/s00339-008-4482-6
Date:
July, 2008
File:
PDF, 603 KB
english, 2008
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