Understanding the crystallization behavior of...

ACS Applied Electronic Materials 2019 / 04

Understanding the crystallization behavior of surface-oxidized GeTe thin films for phase-change memory application

KOLB, Andrea N. D., BERNIER, Nicolas, ROBIN, Eric, Benayad, Anass, Rouviere, Jean-Luc, SABBIONE, Chiara, HIPPERT, Françoise, Noé, Pierre
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Language:
english
Journal:
ACS Applied Electronic Materials
DOI:
10.1021/acsaelm.9b00070
Date:
April, 2019
File:
PDF, 1.62 MB
english, 2019
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