Surface Study of Ge2Sb2Te5-based Electrical Probe Memory...

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Surface Study of Ge2Sb2Te5-based Electrical Probe Memory for Educational Archival Storage

Xie, Li-Zhi
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Year:
2019
Language:
english
Journal:
IEEE Access
DOI:
10.1109/ACCESS.2019.2913046
File:
PDF, 694 KB
english, 2019
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