![](/img/cover-not-exists.png)
A Comparative Study of a Dielectric-Defined Process on AlGaAs/InGaAs/GaAs PHEMTs
Lim, Jong-Won, Ahn, Ho-Kyun, Ji, Hong-Gu, Chang, Woo-Jin, Mun, Jae-Kyoung, Kim, Haecheon, Cho, Kyoung-IkVolume:
27
Language:
english
Journal:
ETRI Journal
DOI:
10.4218/etrij.05.0104.0147
Date:
June, 2005
File:
PDF, 1009 KB
english, 2005