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Redox driven conductance changes for resistive memory
Lian C. T. Shoute, Nikola Pekas, Yiliang Wu, Richard L. McCreeryVolume:
102
Language:
english
Pages:
10
DOI:
10.1007/s00339-011-6268-5
Date:
March, 2011
File:
PDF, 1.72 MB
english, 2011