Impact of amorphous titanium oxide film on the device stability of
Hu Young Jeong, Sung Kyu Kim, Jeong Yong Lee, Sung-Yool ChoiVolume:
102
Language:
english
Pages:
6
DOI:
10.1007/s00339-011-6278-3
Date:
March, 2011
File:
PDF, 1.23 MB
english, 2011