In-situ monitoring of optical near-field material...

Applied Physics A: Materials Science & Processing 2011 / 11 Vol. 105; Iss. 2

In-situ monitoring of optical near-field material processing by electron microscopes

David J. Hwang, Bin Xiang, Sang-Gil Ryu, Oscar Dubon, Andrew M. Minor, Costas P. Grigoropoulos
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Volume:
105
Language:
english
Pages:
5
DOI:
10.1007/s00339-011-6615-6
Date:
November, 2011
File:
PDF, 1.14 MB
english, 2011
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