Nonuniform defect distribution in GaN thin films examined...

Applied Physics A: Materials Science & Processing 2000 / 03 Vol. 70; Iss. 3

Nonuniform defect distribution in GaN thin films examined by cathodoluminescence

D. Sueva, N. Chikov, V. Spassov, E.I. Vapirev, E. Moravska
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Volume:
70
Language:
english
Pages:
3
DOI:
10.1007/s003390050055
Date:
March, 2000
File:
PDF, 196 KB
english, 2000
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