The effect of random dopant fluctuations on the minimum...

Applied Physics A: Materials Science & Processing 1997 / 06 Vol. 64; Iss. 6

The effect of random dopant fluctuations on the minimum channel length of short-channel MOS transistors

T. Mikolajick, V. Häublein, H. Ryssel
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
64
Language:
english
Pages:
6
DOI:
10.1007/s003390050516
Date:
June, 1997
File:
PDF, 354 KB
english, 1997
Conversion to is in progress
Conversion to is failed