Trap characterization for Bi4Ti3O12 thin films by thermally...

Trap characterization for Bi4Ti3O12 thin films by thermally stimulated currents

L. Pintilie, I. Pintilie, D. Petre, T. Botila, M. Alexe
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Volume:
69
Language:
english
Pages:
5
DOI:
10.1007/s003390050980
Date:
July, 1999
File:
PDF, 119 KB
english, 1999
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