Contrast inversion in nc-AFM on Si(111)7×7 due to...

Applied Physics A: Materials Science & Processing 2001 / 03 Vol. 72; Iss. 1 Suppleme

Contrast inversion in nc-AFM on Si(111)7×7 due to short-range electrostatic interactions

M. Guggisberg, O. Pfeiffer, S. Schär, V. Barwich, M. Bammerlin, C. Loppacher, R. Bennewitz, A. Baratoff, E. Meyer
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Volume:
72
Language:
english
Pages:
1
DOI:
10.1007/s003390100629
Date:
March, 2001
File:
PDF, 772 KB
english, 2001
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