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[IEEE 2019 International Conference on Communication and Signal Processing (ICCSP) - Chennai, India (2019.4.4-2019.4.6)] 2019 International Conference on Communication and Signal Processing (ICCSP) - Test Pattern Generation using NLFSR for Detecting Single Stuck-at Faults
Teja, N. Varun, Prabhu, E.Year:
2019
Language:
english
DOI:
10.1109/ICCSP.2019.8697949
File:
PDF, 2.34 MB
english, 2019