[IEEE 2018 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) - Verona, Italy (2018.10.8-2018.10.10)] 2018 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) - Differential Power Analysis Mitigation Technique Using Three-Independent-Gate Field Effect Transistors
Giacomin, Edouard, Gaillardon, Pierre-EmmanuelYear:
2018
Language:
english
DOI:
10.1109/VLSI-SoC.2018.8644747
File:
PDF, 5.74 MB
english, 2018