Evaluation of GALS Methods in Scaled CMOS Technology

Evaluation of GALS Methods in Scaled CMOS Technology

Krstic, Miloš, Fan, Xin, Grass, Eckhard, Benini, Luca, Kakoee, M. R., Heer, Christoph, Sanders, Birgit, Strano, Alessandro, Bertozzi, Davide
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Volume:
3
Journal:
International Journal of Embedded and Real-Time Communication Systems
DOI:
10.4018/jertcs.2012100101
Date:
October, 2012
File:
PDF, 1.90 MB
2012
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