Thermal conductivity measurement and analysis of Ge-Si...

Applied Physics Express 2019 / 04 Vol. 12; Iss. 4

Thermal conductivity measurement and analysis of Ge-Si x Ge 1− x core–shell nanowires

Park, Hyunjoon, Han, Junkyu, Dillen, David C., Park, Joonsuk, Kim, Changho, Sim, Minhyung, Nah, Junghyo, Lim, Jongwoo, Tutuc, Emanuel, Seol, Jae Hun
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Volume:
12
Journal:
Applied Physics Express
DOI:
10.7567/1882-0786/ab0744
Date:
April, 2019
File:
PDF, 613 KB
2019
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