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Computer vision for automatic detection and classification of fabric defect employing deep learning algorithm
Jeyaraj, Pandia Rajan, Samuel Nadar, Edward RajanLanguage:
english
Journal:
International Journal of Clothing Science and Technology
DOI:
10.1108/IJCST-11-2018-0135
Date:
May, 2019
File:
PDF, 348 KB
english, 2019