[IEEE 2019 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - Saint Petersburg and Moscow, Russia (2019.1.28-2019.1.31)] 2019 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - TCAD Simulation Study of 90 nm Junctionless SOI MOSFET
Krasukov, Anton Y., Artamonova, Evgenia A., Korolev, Michail A., Chaplygin, YuriYear:
2019
Language:
english
DOI:
10.1109/EIConRus.2019.8657193
File:
PDF, 365 KB
english, 2019