New view on the variation of forward conduction mechanisms derived from electrical stress in UV-A light emitting diodes
Wang, Ying-Zhe, Zheng, Xue-Feng, Zhu, Jia-Duo, Li, Pei-Xian, Ma, Xiao-Hua, Hao, YueVolume:
130
Language:
english
Journal:
Superlattices and Microstructures
DOI:
10.1016/j.spmi.2019.04.038
Date:
June, 2019
File:
PDF, 1.93 MB
english, 2019