Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2018 / 11 Vol. 12; Iss. 6
Depth Profiling Using Reflected Electron Spectroscopy
Afanas’ev, V. P., Bodisko, Yu. N., Gryazev, A. S., Kaplya, P. S., Fedorovich, S. D.Volume:
12
Language:
english
Journal:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
DOI:
10.1134/S1027451018050531
Date:
November, 2018
File:
PDF, 711 KB
english, 2018