European Microscopy Congress 2016: Proceedings ||...

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European Microscopy Congress 2016: Proceedings || Improvement of a 40-120 kV analytical TEM system for electron beam irradiation sensitive nano materials

Yaguchi, Toshie
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Year:
2016
DOI:
10.1002/9783527808465.emc2016.6106
File:
PDF, 383 KB
2016
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