Degradation analysis based on an extended inverse Gaussian process model with skew-normal random effects and measurement errors
Hao, Songhua, Yang, Jun, Berenguer, ChristopheVolume:
189
Language:
english
Journal:
Reliability Engineering & System Safety
DOI:
10.1016/j.ress.2019.04.031
Date:
September, 2019
File:
PDF, 1.23 MB
english, 2019