X-ray phase-imaging scanner with tiled bent gratings for large-field-of-view nondestructive testing
Kageyama, Masashi, Okajima, Kenichi, Maesawa, Minoru, Nonoguchi, Masahiro, Koike, Takafumi, Noguchi, Manabu, Yamada, Ayuta, Morita, Enji, Kawase, Satomi, Kuribayashi, Masaru, Hara, Yukihiro, Bachche,Journal:
NDT & E International
DOI:
10.1016/j.ndteint.2019.04.007
Date:
April, 2019
File:
PDF, 9.94 MB
2019