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Fluidic applications for atomic force microscopy (AFM) with microcantilever sensors
Seonghwan Kim, Kenneth D. Kihm, Thomas ThundatVolume:
48
Language:
english
Pages:
16
DOI:
10.1007/s00348-010-0830-3
Date:
May, 2010
File:
PDF, 588 KB
english, 2010