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On the independence of statistical randomness tests included in the NIST test suite
SULAK, Fatih, UĞUZ, Muhiddin, KOÇAK, Onur, DOĞANAKSOY, AliVolume:
25
Year:
2017
Language:
english
Journal:
TURKISH JOURNAL OF ELECTRICAL ENGINEERING & COMPUTER SCIENCES
DOI:
10.3906/elk-1605-212
File:
PDF, 128 KB
english, 2017