Stable Metallic Enrichment in Conductive Filaments in TaO...

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Advanced Electronic Materials 2019 / 04

Stable Metallic Enrichment in Conductive Filaments in TaO x ‐Based Resistive Switches Arising from Competing Diffusive Fluxes

Ma, Yuanzhi, Goodwill, Jonathan M., Li, Dasheng, Cullen, David A., Poplawsky, Jonathan D., More, Karren L., Bain, James A., Skowronski, Marek
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Journal:
Advanced Electronic Materials
DOI:
10.1002/aelm.201800954
Date:
April, 2019
File:
PDF, 1.17 MB
2019
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