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Effect of Electron Irradiation with an Energy of 0.9 MeV on the I–V Characteristics and Low-Frequency Noise in 4H–SiC pin Diodes
Dobrov, V. A., Kozlovski, V. V., Mescheryakov, A. V., Usychenko, V. G., Chernova, A. S., Shabunina, E. I., Shmidt, N. M.Volume:
53
Language:
english
Journal:
Semiconductors
DOI:
10.1134/S1063782619040080
Date:
April, 2019
File:
PDF, 562 KB
english, 2019