Determinants of International Patent Examination Outcomes

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SSRN Electronic Journal 2005

Determinants of International Patent Examination Outcomes

Palangkaraya, Alfons, Jensen, Paul H., Webster, Elizabeth M.
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Year:
2005
Language:
english
Journal:
SSRN Electronic Journal
DOI:
10.2139/ssrn.730304
File:
PDF, 455 KB
english, 2005
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