![](/img/cover-not-exists.png)
Burden of Device-Detected Atrial High-Rate Episode Related to Worsening Heart Failure Events
Nishinarita, Ryo, Niwano, Shinichi, Fukaya, Hidehira, Oikawa, Jun, Nabeta, Takeru, Arakawa, Yuuki, Horiguchi, Ai, Nakamura, Hironori, Kishihara, Jun, Sato, Akira, Ako, JunyaVolume:
53
Language:
english
Journal:
Journal of Electrocardiology
DOI:
10.1016/j.jelectrocard.2019.01.042
Date:
March, 2019
File:
PDF, 55 KB
english, 2019