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AIP Conference Proceedings [Author(s) SIXTH INTERNATIONAL SYMPOSIUM ON NEGATIVE IONS, BEAMS AND SOURCES (NIBS 2018) - Novosibirsk, Russia (3–7 September 2018)] - H-minus ion source emittance measuring device
Klenov, V. S., Bragin, S. E., Volodkevich, O. M., Zubets, V. N.Volume:
2052
Year:
2018
Language:
english
DOI:
10.1063/1.5083771
File:
PDF, 1.26 MB
english, 2018