Towards the use of deep generative models for the characterization in size of aggregated TiO 2 nanoparticles measured by Scanning Electron Microscopy (SEM)
Coquelin, L, Fischer, N, Feltin, N, Devoille, L, Felhi, GVolume:
6
Journal:
Materials Research Express
DOI:
10.1088/2053-1591/ab1bb4
Date:
May, 2019
File:
PDF, 1.10 MB
2019