SerialEM: A Program for Automated Tilt Series Acquisition on Tecnai Microscopes Using Prediction of Specimen Position
Mastronarde, David N.Volume:
9
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927603445911
Date:
August, 2003
File:
PDF, 1.12 MB
english, 2003