Highly reliable operation under high case temperature in...

Optical Review 2019 / 2 Vol. 26; Iss. 1

Highly reliable operation under high case temperature in 638-nm BA-LD

Kuramoto, Kyosuke, Abe, Shinji, Miyashita, Motoharu, Kusunoki, Masatsugu, Nishida, Takehiro, Yagi, Tetsuya
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Volume:
26
Language:
english
Journal:
Optical Review
DOI:
10.1007/s10043-018-0478-4
Date:
February, 2019
File:
PDF, 2.83 MB
english, 2019
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