Electric-Current Induced Crack Growth in Thin Films:...

International Journal of Damage Mechanics 2001 / 07 Vol. 10; Iss. 3

Electric-Current Induced Crack Growth in Thin Films: Experimental Observations and Continuum Description

Bastawros, Ashraf F., Kim, Kyung-Suk
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Volume:
10
Journal:
International Journal of Damage Mechanics
DOI:
10.1106/qpac-fg22-rfx5-a1qp
Date:
July, 2001
File:
PDF, 27.39 MB
2001
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