Influence of the bottom metal electrode and gamma irradiation effects on the performance of HfO 2 -based RRAM devices
Arun, N., Vinod Kumar, K., Mangababu, A., Nageswara Rao, S. V. S., Pathak, A. P.Volume:
174
Language:
english
Journal:
Radiation Effects and Defects in Solids
DOI:
10.1080/10420150.2019.1579213
Date:
February, 2019
File:
PDF, 2.27 MB
english, 2019