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Physica B: Condensed Matter 2019 / 5

Frequency Dependent Dielectric Properties of Atomic Layer Deposition Grown Zinc-Oxide based MIS Structure

Efil, E., Kaymak, N., Seven, E., Tataroğlu, A., Ocak, S. Bilge, Orhan, E.
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Language:
english
Journal:
Physica B: Condensed Matter
DOI:
10.1016/j.physb.2019.05.016
Date:
May, 2019
File:
PDF, 1.32 MB
english, 2019
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